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SIG presents at ICSM 2010

September 10, 2010
Between 12 and 18 September, software maintenance specialists from research and industry will convene in Timisoara, Romania for the 26th IEEE International Conference on Software Maintenance (ICSM 2010). SIG will be represented at this conference by Tiago Alves, who will deliver presentations on the fundamentals and on the applications of the SIG Quality Model.
  • Deriving Metric Thresholds from Benchmark Data. SIG has developed a method for deriving metric thresholds from benchmark data. The statistical underpinnings of this method are explained.
  • Assessment of Product Maintainability for Two Space Domain Simulators. To illustrate the use of the SIG Quality Model, its application is explained to two simulator used to support space missions.

We hope to meet you at ICSM 2010!


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